OTIMIZAÇÃO DO TEMPO DE TESTE FUNCIONAL DE PLACA DE CIRCUITO IMPRESSO MONTADA PARA COMPUTADOR PESSOAL

Abstract

The increasing competitiveness among companies in the same sector has made continuous process optimization essential to reduce costs. This study evaluates the time involved in the functional testing phase of motherboards produced in the Industrial Pole of Manaus and proposes improvements for optimization. A system for image capture was developed to analyze idle times, along with test devices and a proprietary Linux-based test system, replacing the previous system that depended on foreign suppliers. Percentage gains were demonstrated through four optimization proposals: unifying tests, performing simultaneous tests on two boards, replacing the test system, and automating the test device. The results obtained after implementing these improvements were positive, reinforcing the importance of applying scientific methodologies combined with innovation to optimize production processes.

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Keywords

Otimização, Teste funcional, Processo produtivo, Polo Industrial de Manaus, Automação

Citation

OLIVEIRA, Edson Farias de. Otimização do tempo de teste funcional de placa de circuito impresso montada para computador pessoal. 2012. Dissertação (Mestrado em Engenharia Elétrica) – Universidade Federal do Pará, Instituto de Tecnologia, Belém, 2012.

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